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ELECTROMETRIC MEASURING DEVICES

1.Subject of electrometry. General information about electrometric methods, means and objects of measurement.
2. Noise and interference in electrometric measuring devices and objects. Sources of emergence. Johnson's noise. Schottky's noise. Parasitic noise effects of insulating materials. Electrostatic interference.
4. Noise and interference in connection of object and meter. Methods for their reduction.
5. Statistical approach to estimate errors. Minimum necessary measuring data.
6. Methods for increasing the noise resistance of electrometric measurements. Schematics design and program - algorithmic actions.
7. Design elements and materials used in electrometric equipment. Parameters and basic requirements.
8. Electrometric converters. Types, basic requirements. Sensitivity threshold of electromechanical transducers.
9. Test methods to increase accuracy in electrometric measuring instruments. Procedures for calibration and self calibration. Requirements for schematic design.
10. Self - testing and diagnostic procedures in electrometric measuring instruments. Verification of operability and metrologically guaranteed accuracy. Principles of circuit and program organization.
11. Multi - functionality in electrometric measuring instruments - additional processor-oriented auxiliary procedures.
12. High - resolution and precision DACs and ADCs used in electrometric measuring instruments. Classification, metrological parameters, areas of application.
13. High - resolution ADCs built using the multi-cycle integration method. Operating principle. Schematic features. Basic metrological parameters.
14. High - precision ADCs built using the continuous integration method. Principle of operation. Schematic features. Basic metrological parameters.
15. High - resolution  ADCs built using the PWM modulation method. Principle of operation. Schematic features. Basic metrological parameters.
16. Stochastic ADCs used in electrometric measuring instruments. Measurement principles. Measurement structures. “True RMS” measurements.
17. Multi - digits DACs. Programmable sources of precise stimulus voltages. Classification, metrological parameters, structural organization and areas of application.
18. Self - calibrating high-resolution DACs - structural and circuit organization, areas of application. Basic metrological parameters.
19. Electrometric nonlinear measuring converters. Classification, metrological parameters. Methods for increasing accuracy
20. Nonlinear ADCs. Classification, metrological parameters, structural organization, areas of application.
21. Electrometric measuring and measuring-stimulating devices and systems. Meters and generators of very small currents.
22. Features of using electrometric measuring equipment. Organization of measuring circuits.
23. Principles of transmission and exchange of information in electrometric measuring instruments and between them. Interfaces.
24. Use of electrometric amplifiers in DC measurement of ultra-low impedance circuits at high levels of disturbing environmental influences.
25. Electrometric measuring amplifiers - features of their use in medical, sensor and industrial electronics.